Measurement of quartz crystal unit parameters - basic method for the measurement of two - terminal parameters of quartz crystal units up to 200 mhz by phase technique in a - network with compensation of the parallel capacitance c0 石英晶體器件參數(shù)的測(cè)定.第3部分:用與并聯(lián)電容量co補(bǔ)償相連的網(wǎng)絡(luò)相位技術(shù)測(cè)量200mhz以下的石英器件的兩極參數(shù)的基本方法
Measurement of quartz crystal unit parameters by zero phase technique in a - network ; part 3 : basic method for the measurement of two - terminal parameters of quartz crystal units up to 200 mhz by phase technique in a w - network with compensation of the parallel capacitance c 在型網(wǎng)絡(luò)中用零相位技術(shù)測(cè)量石英晶體單元參數(shù).第3部分:在具有并聯(lián)電容c補(bǔ)償?shù)膚型網(wǎng)絡(luò)中用相位技術(shù)測(cè)量頻率200mhz及以下石英晶體單元的二端參數(shù)的基本方法
Measurement of quartz crystal unit parameters by zero phase technique in a pi - network - part 3 : basic method for the measurement of two - terminal parameters of quartz crystal units up to 200 mhz by phase technique in a pi - network with compensation of the parallel capacitance c0 用型網(wǎng)絡(luò)的零相位技術(shù)測(cè)量石英晶體器件參數(shù).第3部分:用并聯(lián)電容co補(bǔ)償?shù)木W(wǎng)絡(luò)零相位技術(shù)測(cè)量最高可達(dá)200 mhz的石英晶體器件諧振器兩端參數(shù)的基本方法